J-STD-002C PDF

12 Feb IPC/EIA/JEDEC J-STDB. Solderability Tests for Component Leads,. Terminations, Lugs,. Terminals and Wires. A joint standard developed. This standard prescribes test methods, defect definitions, acceptance criteria, and illustrations for assessing the solderability of electronic component leads. ANSI/IPC J-STDC Solderability Tests for Component Leads, Terminations, Lugs, Terminals and Wires, Includes Amendment 1 (November ) [IPC] on.

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These methods are provided to avoid damage from moisture absorption and exposure to solder reflow temperatures that can result in yield and reliability degradation. It is intended to be used in conjunction with the JESD51 series of standards that cover the test methods and test environments. JESD was developed to give a figure-of-merit of thermal performance that allows for accurate comparisons of packages from different suppliers.

Solid State Memories JC Show 5 10 20 results per page. This standard describes the marking of components and the labeling of their shipping containers to identify their 2nd level terminal finish or material, and applies to components that are intended to be attached to boards or assemblies with solder or mechanical clamping or are press fit.

Displaying 1 – 20 of 32 documents. It can be used to give a first order approximation of system performance and, in jstd-002c with the other JESD51 PCB standards, allows for comparisons of the j–std-002c package families. Its function is to provide an alternate mounting surface for the analysis of heat flow in electronic components. Search by Keyword or Document Number.

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This revision now covers components to be processed at higher temperatures for lead-free assembly. Transistors 2 Apply JC These tests are used frequently in qualifying integrated circuits as a newproduct, a product family, or j-std-00c2 products in a j-std–002c which is j-st-002c changed.

Multiple Chip Packages JC It is used to determine what classification level should be used for initial reliability qualification. The heat is conducted through the leads into the device package from solder heat at the reverse side of the board. This publication describes guidelines for applying JEDEC reliability tests and recommended testing procedures to integrated circuits that require adapter test boards for electrical andreliability testing.

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It forms part of the Part Model XML Schema, which covers the parental structure for the electrical, physical, thermal, assembly process classification data along with materials and substances that may be present in the supplied product or subproducts. The purpose of this test method j-std-02c to provide a means of determining the solderability of device package terminations that are intended to be joined to another surface j-std-00c2 lead Pb containing or Pb-free solder for the attachment.

The dry-packing process defined herein provides a minimum shelf life of 12 months from the seal date. Reaffirmed May JEP Oct This document was written with the intent to provide information for quality organizations in both semiconductor companies and their customers to assess and make j-std0-02c on safe ESD CDM level requirements. This will have a positive effect on quality and reliability as users gain more access to proper methods in designing, producing, and testing parts.

If package warpage or coplanarity is to be characterized at reflow soldering temperatures, then JESDB should be used.

This is intended to facilitate access to the applicable documents when working with electronic hardware. This test method, may be used by users to determine what classification level should be used for initial board level reliability qualification.

This fixturing further defines the environment for thermal test of packaged microelectronic devices. The requirements herein are intended to ensure that such designators are presented in as uniform a manner as practicable.

This standard also applies to 2nd level terminal materials for bumped die that are used for direct board attach. J-STD is now on revision D. Current search Search found 32 items.

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Standards & Documents Search | JEDEC

Mechanical Standardization filter JC This document gathers and organizes common standards and publications relating to quality processes and methods relating to the solid-state, microelectronics, and associated industries.

This standard establishes the requirements for exchanging part data between part manufacturers and their j-str-002c for electrical and electronic products. Stress 1 Apply Thermal. This document identifies the classification level of nonhermetic solid-state surface mount devices SMDs that are sensitive to moisture-induced stress.

The purpose of this test method is to measure the deviation from uniform flatness of an integrated circuit package body for the range of environmental conditions experienced during the surface-mount soldering operation.

Mechanical Standardization 2 Apply JC Reaffirmed June JESDBB Sep The purpose of this test is to measure the deviation of the terminals leads or solder balls from coplanarity at room temperature for surface-mount semiconductor devices. JESD 7 Feb This fixturing further defines the environment for thermal test of packaged microelectronic devices.

This test method also provides a reliability preconditioning sequence for small SMDs that are wave soldered using full body immersion. This document was written with the intent to provide information for quality organizations in both semiconductor companies and their customers to assess and make decisions on safe ESD J-st-d002c level requirements.

This standard applies to all forms of electronic parts. Filter by document type: Terms, Definitions, and Symbols filter JC Registration or login required.

JESDBE Oct This test method provides optional conditions for preconditioning and soldering for the purpose of assessing j-stdd-002c solderability of device package terminations.

This publication provides an overview of solder void types, outlines current metrologies and test methods used for pre-SMPT solder void characterization and potential limitations, and prescribes sampling strategy for data collection, and tolerance guidelines for corrective measures.